XCS Specifications

X-ray Photon Correlation Spectroscopy (XPCS)

Coherent X-ray Scattering (CXS)

Time-resolved pump probe scattering, Absorption and emission spectroscopy in solution phases

Small Angle X-ray Scattering (SAXS)

Grazing incidence Scattering (GI-SAXS,GID)

Wide Angle X-ray Scattering/Diffraction

4.7-25 keV, 1^st harmonic

10-25 keV, 2^nd and 3^rd harmonic

~ 60 x 60 µm² (HxV) FWHM @ 8.3 keV

~ 1.1 x 1.1 µrad² (HxV) FWHM @ 8.3 keV

120, 60, 30, 10 Hz

70-300 fs (highcharge mode)

~ <10 fs (low charge mode)

~ 1-3 mJ (high charge mode)

~ 0.2 mJ (low charge mode)

~1x 10¹² (high charge mode @ 8.3 keV)

~1x 10¹¹ (low charge mode @ 8.3 keV)

A selection (up to 10) of compound refractive lenses can be inserted in the beam to provide focusing at a given energy. By locating the sample at or out of focus, the beam size at the sample can be tuned from a couple of microns to several tens of microns.

Up to 750 x 750 µm² FWHM @ 8.3 keV

4.7-25 keV (1^st harmonic)

10-25 keV (2^nd and 3^rd harmonic)

Silicon (111) 1.4 x 10^-4

Pink beam 2-3 x 10^-3